Comments on “On Deembedding of Port Discontinuities in Full-Wave CAD Models of Multiport Circuits”

Several additional comments are appropriate for the above well-written paper [1] on electromagnetic (EM) deembedding. The above paper [1] extends the short-open-calibration (SOC) deembedding technique to multiple coupled ports [vector short-open-calibration (VSOC)]. While not widely realized, the SOC technique is closely related to the double-delay EMdeembedding first described in [2] and in commercial use in Sonnet for nearly two decades [3], [4]. To our knowledge, [2] is the first paper to apply modern microwave measurement deembedding techniques to EM analysis, initiating EM research in this area. Double-delay deembedding uses two standards, a through line of length L, and a second line of length 2L. The SOC technique uses a single through line of length 2L. This standard is identical to the